Conductive atomic force microscopy (C-AFM) is a powerful nanoscale characterization technique that combines the high-resolution imaging capabilities of atomic force microscopy (AFM) with the ability ...

First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...

Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

There has been much research on the fabrication of nanochannels using local oxidation and consequent etching of silicon surfaces. Although this technique has been extensively demonstrated, it has the ...

What Is Atomic Force Microscopy? Atomic force microscopy (AFM) is a powerful technique that enables surface ultrastructure visualization at molecular resolution. 1 Besides three-dimensional (3D) ...

Atomic force microscopy is a powerful technique that has been widely used in materials research, nano-imaging, and bioimaging. It is a topographical metrology approach that is commonly utilized in ...

Scientists at the Department of Energy's Oak Ridge National Laboratory have reimagined the capabilities of atomic force microscopy, or AFM, transforming it from a tool for imaging nanoscale features ...

The Park FX40 Automatic Atomic Force Microscope (AFM) System is capable of high spatial resolution surface mapping and is equipped with a True Non-Contact TM mode capable of nanoscale surface analysis ...

Atomic force microscopy (AFM) has been leveraged to study the surface defects of natural rubber vulcanizates so that their structural−mechanical properties can be defined. This data is vital to ...