Abstract: The junction temperature is a significant indicator for evaluating the reliability of insulated gate bipolar transistors (IGBTs). In this article, in order to realize noninvasive and simple ...
Abstract: This article proposes a machine-learning (ML) method to accelerate atomic-level device simulation. The main idea is to utilize graph convolutional network (GCN) to predict the potential ...
Toshiba has put single logic gates into the 1 x 1.45mm XSON6 package, in two series with differing input characteristics. 12 of them are in the 7UL1G series, which operate across 0.9 to 3.6V and have ...
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