Silicon Semiconductor

ZEISS Microscopy spotlights Advanced Failure Analysis Technologies at ISTFA

ZEISS to sponsor, exhibit and present at 51st ISTFA conference. ZEISS Microscopy will once again make a strong showing at the ...
AZoOptics

A New AI-Powered Method to Automate Material Analysis and Design

X-ray absorption spectroscopy (XAS) provides valuable information about a material’s properties and electronic states.
AZoAI on MSN

Tokyo Scientists Use AI to Decode Material Structures From X-Ray Spectra

Researchers at Tokyo University of Science have developed an AI-based method to automatically analyze X-ray absorption ...

X-ray techniques map and measure the invisible properties of altermagnets

The new big thing in magnetics is altermagnetism, a form of magnetism that promises to power the next generation of ...
AZoM

Why CT Microstructure Analysis is Non-Negotiable for Tablet Development

CT analysis of tablet microstructure reveals critical insights into disintegration and dissolution, driving improvements in ...